[China Instrument Network Instrument R&D] Recently, the 2mm frequency band of the Second Institute of Aerospace Science and Technology Co., Ltd. achieved a breakthrough in the research of wafer alignment technology and reached the domestic leading level. The ability to improve the on-chip S-parameter calibration has important implications for improving the design and manufacturing level of millimeter-wave devices in China. The technology will be applied in vehicle radar, runway foreign object detection, and Fengyun No. 3 meteorological sounding, with certain economic and social benefits.
The on-chip S-parameter is an extremely important indicator of the electrical characteristics of a bare chip. It covers reflection and transmission characteristics, amplitude and phase characteristics, and can be applied to almost all on-chip devices such as low-noise amplifiers and power chips. The electrical characteristics are fully characterized. With the continuous improvement of the millimeter wave design and manufacturing level in China, there are dozens of types of millimeter-wave devices to achieve localization. However, compared with the design and manufacture of water products in advanced countries in the world, there are still some gaps in the performance indicators of millimeter-wave components designed and developed in China.
The measurement and calibration of the S-parameters of the on-chip circuit can be performed to ensure the accuracy of traceability, meet the traceability requirements, and regulate the calibration of on-chip S-parameter measurements. The on-chip S-parameter measurement can track the entire process of product design, shaping, and production, ensuring that the on-chip die design and development stage has an accurate measurement of the S-parameter characteristics of the product, avoiding packaging and The impact of the test stand ensures the quality of the product and shortens the product development cycle.
Chen Ting, the person in charge of the project, said that in the future, the 203 Institute will fully roll out on-chip S-parameter calibrations, apply for national calibration and testing capabilities, and continue to open up markets for measurement and calibration capabilities.
(Original title: China made a breakthrough in the 2mmS parameter calibration technology research)